TP - ES

Entry level system, one piece body construction mounted in a fixed vertical axis. Most economical touch probe. Usable with M2/M3 Styli including extensions to extend deep into features

PH6

A compact, vertical probe head for a single probe, with a choice of integral cables

PH6M

A fixed head with autojoint connection for probes and adaptors.

PH10T PLUS

The new PH10T PLUS motorized probe head allows complete, rapid, and repeatable inspection of most complex components with minimum human intervention. Full orientation of your TP2, TP6, TP20 or TP200 probe between any of 720 positions, under manual or program control, turns your 3 axis CMM into a 5 axis machine.

PH10M PLUS

The PH10M PLUS motorized probe head has been developed for the new generation of contact and non-contact scanning probes. It has three times the torque of PH10, allowing probe extension bars up to 300 mm long to be used.

PH10MQ PLUS

The PH10MQ PLUS can be mounted vertically inside the CMM’s quill for a greater working envelope by increasing the Z axis travel.

MH8

A manually indexable probe head with repeatable indexing, eliminating the need to requalify the stylus tip position after orientation. The MH8 can be used with the TP6 probe directly or with the TP20 probe with up to 50 mm extension. An easy upgrade, as there is no need for special software, cabling, or electronics.

MH20

The MH20 is an ultra-compact manually adjustable probe head offering maximum flexibility in probe orientation. The full range of TP20 probe modules can be used via its integral probe mounting. The MH20 is incompatible with the MCR20.

MH20i

The MH20i offers the significant advantage of repeatable indexing positions, vastly improving productivity for multi-orientation measurement applications. The MH20i is incompatible with the MCR20.

RTP20

Renishaw’s new RTP20 compact head for DCC coordinate measuring machines (CMMs) offers low-cost ‘motorized’ head functionality and integral TP20 touch-trigger probe

The new RTP probe head allows the integral probe to be moved to 168 repeatable positions in 15° increments using both A and B axes, allowing a one‑time qualification for a stylus tip position. This eliminates the need for costly time-consuming requalification routines, ensuring fast throughput for part inspection. Users can therefore easily access features to be measured and optimize system performance by ensuring the probe is applied to the surface at the best angle to achieve accurate measurements.